The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 1997
Filed:
Sep. 23, 1996
Michael Barenboim, Boca Raton, FL (US);
Peter Michael Baumgart, San Jose, CA (US);
Peter P Chrusch, Boynton Beach, FL (US);
Benny Michael Harper, Boca Raton, FL (US);
Benjamin Karni, San Jose, CA (US);
Pieter J Kerstens, Boca Raton, FL (US);
Michael Gerard Lisanke, Boynton Beach, FL (US);
Hong S Seing, Boca Raton, FL (US);
Huizong Lu, Coconut Creek, FL (US);
Lanphuong Thi Pena, Fort Lauderdale, FL (US);
Ali Reza Taheri, Boca Raton, FL (US);
Andrew Ching Tam, Saratoga, CA (US);
Abstract
Inspection apparatus for determining the profile of textured spots extending in a pattern along a surface of a magnetic disk includes an interferometer which illuminates first and second, adjacently disposed test spots on the surface. The disk and the interferometer are moved, relative to one another, so that one of the test spots traverses the textured spots in the pattern while the other test spot is moved along a flat portion of the disk surface. In one embodiment, the inspection apparatus is built into the device forming the textured spots, providing feedback controlling the texturing process.