The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 1997

Filed:

May. 15, 1995
Applicant:
Inventors:

Phillip H Darling, Buena Park, CA (US);

Hoai X Le, Fountain Valley, CA (US);

Thai Le Khac, Paramount, CA (US);

Assignee:

Northrop Grumman Corporation, Los Angeles, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324238 ; 324240 ; 324243 ; 324642 ;
Abstract

A portable measuring device for measuring electromagnetic radiation reflection. The device has a holder, a transceiver, and a display. The transceiver is movably mounted to the holder. The holder can be moved to several locations on a member being tested. The transceiver is moved up and down on the holder through the peaks and valleys of the reflected electromagnetic wave, in and out of phase, passing through and detecting the maximum reflected energy point. A system can be provided that uses the measurement at a predetermined frequency in comparing the measured property to a characteristic curve of the property for the material of the member being tested. The system can be used to plot a three-dimensional graph of surface reflection of the electromagnetic energy.


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