The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 1997

Filed:

May. 20, 1996
Applicant:
Inventor:

Nand K Gupta, Libertyville, IL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250358 ; 2503601 ;
Abstract

An apparatus adapted for inspecting and measuring the wall thickness of a length of pipe. The apparatus includes a carriage adapted to be movably mounted along the length of pipe, a source emitting a beam of penetrating energy and a detector array having a plurality of detectors arranged in an elongated array. The array receives and measures the intensity of the energy beam. The detector array is mounted on the carriage in a spaced apart relationship with the source so as to allow the diameter of the pipe to pass between them. The detector array is oriented so that its length is positioned generally perpendicular to the intended path of travel. A method is also provided for inspecting and measuring the wall thickness of the pipe. The method includes the steps of providing a length of pipe and an apparatus that includes a source of penetrating energy and a elongated detector array mounted on a carriage. The method also includes positioning the apparatus on the pipe so that the diameter of the pipe is disposed between the array and the source, and propelling the apparatus along the axial direction of the pipe while receiving and measuring the intensity of the energy beam received by the detector array.


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