The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 1997

Filed:

Apr. 12, 1995
Applicant:
Inventors:

Halina M Parzuchowski, Ballwin, MO (US);

Mark K Reighard, O'Fallon, MO (US);

Kevin G Kintz, St. Charles, MO (US);

Assignee:

McDonnell Douglas Corporation, St. Louis, MO (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73643 ; 73588 ; 73583 ; 73635 ; 73633 ; 73640 ;
Abstract

A method and apparatus for non-destructive inspection of complex structures employs a portable laser based ultrasonic transducer 600 output to rapidly detect and size flaws in such structures, including the radii of composites, laminates, and complex skin/substructure assemblies, such as airplane wings. A fiber optic delivery system 610A is employed with the laser based ultrasonic transducer 600 and a thermoelastic medium to rapidly and accurately access the radii of complex structures in the field without the need for liquid or gel couplants, with the thermoelastic expansion of the test piece 680 producing mechanical stresses that initiate detectable sound waves regardless of the angle of the laser based ultrasonic transducer 600 output with respect to the test piece 680. A MAUS III scanning device may be employed to detect these sound waves and provide accurate information as to the detected flaws.


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