The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 1997
Filed:
Jul. 01, 1996
Jurg Zehr, Uster, CH;
Zellweger Luwa AG, Uster, CH;
Abstract
The invention relates to a device for measuring the thickness and/or irregularity of slivers, with a compacting part (2) compacting the sliver and with a measuring part which has a gutter-like guide conduit (8) for the compacted sliver and a sensing member (10) which senses the sliver mechanically and which is adjustable relative to the guide conduit. In order to allow more accurate measurement, the sensing member is likewise of gutter-like design in a region in contact with the sliver and forms a kind of guide conduit (15), so that, in the measuring part, the sliver runs through a guide conduit consisting of a fixed part (13) and of a part (14) adjustable relative to the fixed part (13). The adjustable part is fastened to deflectable carriers (11, 12), and the measurement of the thickness and/or irregularity of the sliver is carried out by measuring the adjustment of at least one of the said carriers.