The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 1997
Filed:
Apr. 10, 1995
Applicant:
Inventors:
Christian Hentschel, Gaeufelden, DE;
Emmerich Mueller, Aidlingen, DE;
Clemens Rueck, Bondorf, DE;
Edgar Leckel, Jettingen, DE;
Assignee:
Hewlett-Packard Company, Palo Alto, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01S / ;
U.S. Cl.
CPC ...
364574 ; 359110 ; 359337 ; 359177 ; 359341 ;
Abstract
A method and apparatus for measuring the noise level in an optical amplifier in the presence of a signal at a signal wavelength. The signal is detuned to a second wavelength different from the signal wavelength. A difference function corresponding to the difference in noise levels before and after detuning of the signal as a function of wavelength is determined. The noise level at the signal wavelength is measured. The value of the difference function at the signal wavelength is added to the noise level measured in the previous step.