The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 1997
Filed:
Nov. 27, 1995
Toshihiro Okumura, Nukata-gun, JP;
Junji Ikeda, Kariya, JP;
Nippondenso Co., Ltd., Kariya, JP;
Abstract
A semiconductor substrate production control system controlling the production of semiconductor substrates grouped as lots so that a delay of each lot between processing operations does not exceed a time limit within which the amount of deterioration of the substrates exceeds permissible levels when plural types and plural lots of semiconductor substrates are arbitrarily provided in a process requiring consecutive processing operations. A first control unit controls the progress of production of the semiconductor substrates per lot and various processing equipment. Storage stations store the lots. First and second processing equipment implement predetermined processing operations on the lots, and a conveyer conveys the lots between the storage unit and the first and second processing equipment. A reserving unit calculates processing starting and ending times of the first and second processing equipment for each lot scheduled to be conveyed thereto so that the leave-over time of each lot, which is the time during which the lots are between processing operations, is kept within a predetermined time limit so that an amount of deterioration of the lot is within permissible levels. Finally, a setting unit sets the processing conditions for the first and second processing equipment.