The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 1997
Filed:
Jun. 06, 1995
Wolfgang Barwald, 1140 Berlin, DE;
Thomas Terzibaschian, 1120 Berlin, DE;
Marita Wahlisch, 1165 Berlin, DE;
Other;
Abstract
In a Fourier spectrometer arrangement for Fourier transforming an interferogram for determining the optic spectrum of a radiation, the readout of the interferogram is decoupled from particular phase positions of the reference signal through elimination of otherwise required synchronization with an external fixed clock pulse to thereby enable a lowering of the reference frequency and simultaneously to maintain or increase the scan frequency of the interferogram. The Fourier spectrometer arrangement includes an extrapolation filter which receives the incoming reference signal and employs adaptive state estimation processes in order to generate extrapolation values by which the future course of the reference signal can be projected. These extrapolation values can be calculated at times which are closer together than, e.g., zero crossings of the reference signal and may have an arbitrary phase position thereto. In this manner, the interferogram can be scanned at times which are independent of the phase position of the reference signal and, if necessary, at shorter intervals.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile