The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 1997

Filed:

Sep. 08, 1995
Applicant:
Inventor:

Bartley Clark Johnson, Clayton, MO (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356 355 ; 356345 ; 356352 ;
Abstract

An apparatus (60) or system (30) for determining a differential time derivative of strain in a device that has a low coherence light source (32) coupled to a plurality of Fabry-Perot etalons (62). The reflected signals from the Fabry-Perot etalons are coupled to a beam splitter (44) or acousto-optic modulator (66). A first beam (48) and a second beam (50) from the output (46) of the beam splitter (44) are combined in at least one interferometer (52, 64). The outputs of the interferometers (64) are detected by a plurality of detectors (124). The outputs of the detectors (124) are coupled to a plurality of FM demodulators (127). The output of the FM demodulators (127) are a plurality of signals proportional to the difference in the time derivative strain at the pair of mirrors (94, 96) of one of the Fabry-Perot etalons (62)


Find Patent Forward Citations

Johnson, Bartley. (1997). Method, apparatus and system for determining the differential rate of (U.S. Patent No. 5696579). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5696579

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