The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 1997
Filed:
May. 07, 1996
Kiyoshi Tsuboi, Musashino, JP;
Shigeharu Yamamoto, Yokohama, JP;
Iwatsu Electric Co., Ltd., Tokyo, JP;
All Nippon Airways Co., Ltd., Tokyo, JP;
Abstract
A method and apparatus for detecting a defect of an object to be measured that has a first section having a first plate part and a second plate part which has a plate surface opposite to a plate surface of the first plate part and is integral with the first plate part or is connected to the first plate part and a second section that is united integrally with the first section or is bonded to the first section. The object to be measured has an intersection part formed between the plate surface of the first and/or second plate part of the first section and the surface of the united part of the second section with the first section, any defect formed in the intersection part being detected. Further, if the first section is a major working section, the life of the object to be detected is detected by detecting deterioration of the first section.