The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 1997

Filed:

Jan. 19, 1996
Applicant:
Inventor:

Masashi Toda, Kariya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
D03J / ; D03D / ; D06H / ; D06H / ;
U.S. Cl.
CPC ...
139 / ; 26 70 ; 25055901 ; 25055939 ; 242534 ; 356431 ; 1393702 ; 139353 ; 139351 ;
Abstract

A woven cloth inspecting apparatus eliminates the influences of disturbances such as illuminating light and fly. At least two photoreceptor elements are arranged in the direction of the weft yarn of woven cloth. The photoreceptor elements detect different area of the woven cloth and they apply current signals to two respective current-to-voltage converters which convert the current signals into voltage signals which are fed to a difference calculating circuit. The difference calculating circuit calculates the difference between the values of the voltage signals received from the two current-to-voltage converters and supplies the obtained difference signal to a comparator which compares the received difference signal with a reference value preset by two reference value setting circuits. Exceeding the reference value is indicative of a defect in the warp. Alternatively the photoreceptor elements are arranged in the warp direction and detect defects in the weft. Also, photoreceptor elements can be located in both the weft and warp directions.


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