The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 1997

Filed:

Apr. 28, 1995
Applicant:
Inventors:

Norman Madden, Livermore, CA (US);

Richard Pehl, Berkley, CA (US);

Robert G Carroll, Largo, FL (US);

Louis McKellar, Los Altos, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
1286531 ; 128659 ; 25036302 ; 2503631 ;
Abstract

A system and method for diagnostic testing of structures within a body, e.g., organs within the body of a living being, which has been provided with a radioactive imaging agent, e.g., a radiotracer, to cause the structure to produce gamma rays, associated characteristic x rays, and a continuum of Compton-scattered photons. The system includes a radiation receiving device, e.g., a hand-held probe or camera, an associated signal processor, and an analyzer. The radiation receiving device is arranged to be located adjacent the body and the structure for receiving gamma rays and characteristic x rays emitted from the structure and for providing a processed electrical signal representative thereof. The processed electrical signal includes a first portion representing the characteristic x rays received and a second portion representing the gamma rays received. In a preferred embodiment of the invention the signal processor removes the signal corresponding to the Compton-scattered photons from the electrical signal in the region of the full-energy gamma ray and the characteristic x ray. The analyzer is arranged to selectively use the x-ray portion of said processed signal to provide near-field information about the structure, to selectively use both the x-ray and the gamma-ray portions of said processed signal to provide near-field and far-field information about the structure, and to selectively use the gamma-ray portion of said processed signal to provide extended field information about the structure.


Find Patent Forward Citations

Madden, Norman. (1997). Apparatus and methods for determining spatial coordinates of (U.S. Patent No. 5694933). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5694933

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