Method for calibrating specimen with specimen holder of a microscope

Abstract

A method and device for the calibration of microscope slides for use in accurate and repeatable position location and relocation of specific areas of a specimen on the slide, particularly with use of computer correlated location of specimen events. Deviation from orthogonality of a specimen holder positioned on a stage (relative to movement of the microscope slide stage) is determined and compensated for by means of a rectangular calibration slide having a predetermined fixed length diagonal, and visual fixation sites at the ends of the diagonal, i.e., opposite corners of the slide, for the position marking of the corners and determination of the diagonal and its position. The calibration slide is placed on the microscope stage, against a fixed position portion of the slide holder. The viewfinder of the lens is then moved to superimpose and enter a calibration mark directly on two opposite corners of the calibration slide, or on location marks on the calibration slide which are a pre-set distance from such opposite corners. Entry of the corner positions locates a diagonal line of the appropriate length and of a particular slope, relative to the x-y axes of microscope stage movement. Deviation of the obtained slope from a predetermined slope for a true orthogonal position for the slide, is calculated and used to compensate for deviations in locating and relocating areas on a specimen subsequently positioned on the specimen holder.