The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 1997
Filed:
Jun. 04, 1996
Yasunori Ueno, Kanagawa-ken, JP;
Nikon Corporation, Tokyo, JP;
Abstract
An eye examination apparatus enables the examination of a condition of an eye (e.g., the refractive power of an eye, the focus state of the apparatus on the eye) being examined with high precision even when there is a partial obstruction such as a partial crystalline lens cloudiness or partial vitreum cloudiness in the eyeball of the eye. A light projecting optical system projects light (an image) onto a fundus of the eye being examined. A light-receiving element receives the light (the image) reflected from the eye fundus and outputs a waveform representative of the received reflected light. A waveform rectifying device rectifies the output waveform from the light-receiving element by correcting a disorder of the light-receiving element output waveform caused by partial obstruction in the eyeball or the like when such a disorder is determined to be present. The condition (e.g., refractive power, the focus states, etc.) of the partially obstructed eye is then determined using the rectified waveform from the waveform rectifying device. The eye examining device can further include an illuminating optical system that emits illuminating light on the eye fundus and a photographic optical system for photographing or observing the eye fundus illuminated by the illuminating optical system.