The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 1997
Filed:
Jun. 10, 1996
Norman S Neidell, Houston, TX (US);
Wavefield Image, Inc., Houston, TX (US);
Abstract
Acquired signals representing samples of propagating wavefields are processed using space-time linked variable methods to form images having better definition and resolution than may be obtained by conventional methods. Frequencies accessed include those anticipated as well as some apparently beyond those deemed feasible according to Nyquist criteria as well as those present in the wavefield source. The signals and physical features may be obtained in tomography (medical CT scans), echo location (radar or sonar) or seismic imaging for example. Signals are processed maintaining interrelation of the linked variables of time and space, rather than following the conventionally accepted current techniques which treat the time and space variables independently. Definition and resolution of images are obtained beyond those normally considered possible with earlier techniques by understanding and correctly interpreting the information content of a sampled wavefield. Data acquisition speed can be greatly increased, while acquisition costs are also reduced since the methods described require less data and use such data as available more effectively.