The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 1997
Filed:
Oct. 17, 1996
Kazunari Kirii, Aichi-ken, JP;
Masahiro Shinabe, Toyota, JP;
Abstract
A diagnostic method of diagnosing a press for the presence of any abnormality that deteriorates a quality of a product manufactured by the press, wherein physical value (Fs, Fsi, Ff, Ffi, Fp, Fpi, Xsi, Xei, Xy, Xz, Vx, Gx, Gy, Gz, Temp A, Temp B, Va0, Vf0, Vd0, V, Aa, Ag, Az, Afi, Ps, Pmai, Psa, Paa, Pyai, Peai, Pzai) such as a load generated at a selected portion of the press during operation of the press is detected, and the press is diagnosed for any abnormality, on the basis of the detected physical value, and according to a predetermined reference. For example, the diagnosis is effected based on: a waveform of a load detected in relation to a physical value which changes during a pressing cycle; a distribution of local values of the load detected local portions of the press; a correlation between the load and the physical value; a pattern of variation of the load as the number of pressing cycles; a displacement amount, velocity or acceleration, or a temperature of a selected component of the press; or a capacity of a fluid used for a cylinder which produces a load or force.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile