The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 1997
Filed:
Jun. 02, 1995
Yutaka Ishizaka, Kawasaki, JP;
Fuji Electric Co., Ltd., Kawasaki, JP;
Abstract
A contour inspecting device for detecting a defect in a contour of an object to be inspected according to the invention comprises; an image memory for storing an image of the inspection object captured by a camera; a scanner for scanning, along a plurality of scanning lines, an inspection region which covers a part of the image stored in the image memory; a binary unit for converting an image signal read out by the scanner into a binary signal; a detector for detecting positions of changing points at which the value of the binary signal changes; a comparator for calculating a difference between positions of the changing points on two of the plurality of scanning lines separated from each other by a predetermined interval; and a decision unit for determining whether or not the contour of the inspection object has a defect on the basis of a comparison of the difference with a predetermined value.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile