The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 1997

Filed:

Jan. 12, 1996
Applicant:
Inventor:

Eric I Madaras, Yorktown, VA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73644 ; 73625 ; 73629 ;
Abstract

A method for ultrasonic imaging of interior structures and flaws in a test specimen with a smooth or irregular contact surfaces, in which an ultrasonic transducer is coupled acoustically to the contact surface via a plurality of ultrasonic wave guides with equal delay times. The wave guides are thin and bendable, so they adapt to variations in the distance between the transducer and different parts of the contact surface by bending more or less. All parts of the irregular contact surface accordingly receive sound waves that are in phase, even when the contact surface is irregular, so a coherent sound wave is infused in the test specimen. The wave guides can be arranged in the form of an ultrasonic brush, with a flat head for coupling to a flat transducer, and free bristles that can be pressed against the test specimen. By bevelling the bristle ends at a suitable angle, shear mode waves can be infused into the test specimen from a longitudinal mode transducer.


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