The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 1997
Filed:
Dec. 20, 1995
Applicant:
Inventor:
Christoph Gerz, Ottering, DE;
Assignee:
Giesecke & Devrient GmbH, Munich, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73580 ; 73159 ; 73627 ; 73597 ;
Abstract
The invention relates to a method and apparatus for dynamic determination of the thickness and/or basis weight of moving material under test. The material under test is exposed to a focused ultrasound filed with high sound intensity, whereby the sound fraction coming from the material under test is detected directly in the near filed, i.e. at a distance smaller than or equal to the acoustic wavelength used, and evaluated for determining the thickness and/or basis weight. The near-field measurement preferably takes place with continuous sound and in transmission.