The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 1997

Filed:

Jun. 11, 1996
Applicant:
Inventors:

Kazuyuki Watanabe, Oita, JP;

Satoshi Iwamoto, Oita, JP;

Assignee:

Showa Denko K.K., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B / ; B32B / ; B65D / ;
U.S. Cl.
CPC ...
428516 ; 428 357 ; 428 352 ;
Abstract

A polyolefin composition, which comprises: (A) 1 to 99% by weight of a polyolefin having the following properties of (a) to (e); (a) a ratio of kinematic viscosity .eta..sub.1 at a frequency of 10.sup.-1 rad/sec to kinematic viscosity .eta..sub.2 at a frequency of 10 rad/sec at a temperature of 190.degree. C. according to a kinematic viscoelasticity determination method of 4 to 20, (b) a crystallization peak temperature Tcp according to a Differential Scanning Calorimetry of 110.degree. C. to 130.degree. C., (c) a ratio (Tmp/Tcp) of melting peak temperature Tmp to crystallization peak temperature Tcp according to a Differential Scanning Calorimetry of 1.1 to 1.5, (d) Tmp/(Tmp-Tcp)=3.0 to 9.8, and (e) a crystal structure exhibiting a-axial orientation in a diffraction pattern according to a X-ray diffraction method, and (B) 99 to 1% by weight of a propylene resin having the following properties of (f) and (g); (f) a ratio of kinematic viscosity .eta..sub.1 at a frequency of 10.sup.-1 rad/sec to kinematic viscosity .eta..sub.2 at a frequency of 10 rad/sec at a temperature of 190.degree. C. according to a kinematic viscoelasticity determination method of below 4, and (e) and no crystallization structure exhibiting a-axial orientation in a diffraction pattern according to a X-ray diffraction method.


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