The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 1997

Filed:

Dec. 19, 1995
Applicant:
Inventor:

Hiroyuki Tsujino, Otawara, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
12866004 ; 12866005 ; 1286611 ;
Abstract

An ultrasound diagnostic apparatus comprises an ultrasonic transducer and a transmitter/receiver circuit for scanning a plane section of a human body under examination with ultrasonic beams repeatedly and with a given frame period to thereby obtain receiving signals, an ultrasonic image producing circuit responsive to the receiving signals for producing ultrasonic images successively and with the frame period, an image memory unit for storing ultrasonic images corresponding to multiple frames along with time information, a setting section for setting a period of interest, a CPU for reading a sequence of ultrasonic images corresponding to the set period of interest from the image memory unit selectively and with the frame period, an overlaid image producing circuit for producing an overlaid image containing an ROI marker and outputting it repeatedly and with the frame period, a frame combining circuit for combining each of the ultrasonic images and the overlaid image which are supplied synchronously with each other into one frame, a display monitor for displaying the ultrasonic images with which the overlaid image was combined as moving images, a CPU for changing the position of the ROI marker in the overlaid image, and a measuring circuit for obtaining measured values in the position of the ROI marker.


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