The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 1997
Filed:
Jul. 03, 1996
Kimiyo Shibata, Kakogawa, JP;
Yoshihiro Mishima, Kobe, JP;
Toa Medical Electronics Co., Ltd., Hyogo, JP;
Abstract
A method and apparatus for determining a particle criterion to set a predetermined region as the particle criterion in a distribution data of a particles of a specimen and to analyze the specimen based on particles which appear in the predetermined region, includes preparing first fundamental distribution data by accumulating each distribution data of a first specimen group which belongs to a first category, preparing second fundamental distribution data by accumulating each distribution data of a second specimen group which belongs to a second category, calculating a region on the distribution data where peculiar particles exist in the first or second category by comparing the first and second fundamental distribution data and establishing the calculated region as the particle criterion. The region may also be shifted if needed.