The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 1997

Filed:

Aug. 26, 1996
Applicant:
Inventors:

Kung Linliu, Taipei, TW;

Erik Syangywan Jeng, Taipei, TW;

Tzu-Shih Yen, Taipei, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
437 60 ; 437191 ; 437919 ;
Abstract

A method for manufacturing an array of double-crown-shaped storage capacitors with increased capacitance on a dynamic random access memory (DRAM) device has been achieved. The invention utilizes a polysilicon and silicon nitride spacer to form the double-crown capacitors while forming concurrently bit lines and node contacts for the bottom electrodes of the storage capacitors. A silicon nitride layer and a silicon nitride spacer are used to insulate the bit lines from the capacitors formed thereon. The polysilicon sidewall spacer is used to pattern a very narrow vertical insulating structure on which is formed the polysilicon double crown by depositing another polysilicon layer which is etched back. The vertical insulating structures are removed by selective etching leaving a free-standing bottom electrode having a double-crown-shaped structure. An interelectrode dielectric layer having a high dielectric constant, and a final polysilicon layer are deposited to complete the storage capacitors for the DRAM.


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