The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 1997

Filed:

Jul. 24, 1995
Applicant:
Inventors:

Craig C Staab, Mesa, AZ (US);

David P Olson, Tempe, AZ (US);

Assignee:

VLSI Technology, Inc., San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01R / ;
U.S. Cl.
CPC ...
439 66 ; 439 71 ;
Abstract

The present invention relates to a universal contactor system for testing multiple size BGA devices on multiple types of testing equipment. The universal contactor system is comprised of a plurality of pogo pin which provide a connection between the BGA device to be tested and a DUT (Device Under Test) board. A contactor block having a plurality of apertures therethrough is used for holding the plurality of pogo pins. A guide plate having a center opening is coupled to the contactor block. The center opening in the guide plate is used for aligning the BGA device to be tested on the contactor block. The guide plate may be replaced with guide plates having a larger or smaller opening to align BGA devices of a larger or smaller size on the contactor block.


Find Patent Forward Citations

Staab, Craig. (1997). Universal contactor system for testing ball grid array (bga) devices on (U.S. Patent No. 5688127). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5688127

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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