The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 1997
Filed:
Jun. 21, 1996
Tatsuro Otaki, Tokyo, JP;
Chikaya Iko, Yokohama, JP;
Nikon Corporation, Tokyo, JP;
Abstract
The present invention relates to a photographic apparatus comprising a photometric system which can tolerate a wide range of change in contrast. This photographic apparatus attains, at least, a state in which an image from an optical instrument such as microscope can be photographed and a state in which the light intensity of the image formed by the optical instrument can be measured by the photometric system utilizing a light separated from incident light. This photometric system comprises a plurality of optical systems respectively having magnifications different from each other and a photosensor having a light receiving surface defined by a plurality of light intensity detectors, wherein these plurality of optical systems and plurality of detectors are intentionally selected so as to change the range of measurement of an image formed on the light receiving surface of the photosensor.