The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 1997

Filed:

Feb. 29, 1996
Applicant:
Inventor:

Mitsuo Baba, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03D / ;
U.S. Cl.
CPC ...
375376 ; 375375 ;
Abstract

A digital PLL circuit has a data sampling circuit for sampling input data in response to N phase clocks in the direction of time. The phase of the clock corresponding to, among the sampled data, the data in which edges are evenly detected is used as a first phase or reference clock. The successive clocks following the first phase clock are used as a second phase clock to an N-th phase clock. The sampled data are rearranged in synchronism with the first phase clock to the N-th phase clock to turn out first phase to N-th phase sampled data. The first phase to the N-th phase sampled data are latched by the first phase clock. The pattern of data received in bursts is identified every period on the basis of the latched first to N-th phase data. Among the latched first to N-th sampled data, the data to be identified are selected. These data are retimed in synchronism with the first phase clock so as to output a phase clock signal.


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