The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 1997
Filed:
Sep. 28, 1995
John F Walsh, Rochester, NY (US);
James W Stevens, Rochester, NY (US);
Xerox Corporation, Stamford, CT (US);
Abstract
A method for varying a scanline rate of a digital scanner while maintaining a constant integration period. The scanner scans a scanline of an image, integrates an array of photosensors after a first predetermined period of time has elapsed and after a second predetermined period of time has elapsed. One of the predetermined periods is equal to an integration period of the array of photosensors, and the other period is equal to a difference between a time needed to process a scanline of image data and the integration period of the array of photosensors. The scanner produces a scanline of valid image data and a scanline of image data corresponding to the first scanned scanline. The scanner then scans the next scanline of the image. By having a variable dummy or garbage integration period in conjunction with the analog image unit's constant rated integration period to form the scanline period, a scanner can utilize a variable scanline period while maintaining a constant integration period and a synchronous scanning operation so as to capitalize on the increase efficiency of new photosensors and faster microprocessors and other processing circuitry.