The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 1997

Filed:

Sep. 12, 1995
Applicant:
Inventors:

Ichiro Sasada, Fukuoka, JP;

Takao Yamauchi, Kitakyushu, JP;

Assignee:

Kyushu University, Fukuoka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ; A61B / ;
U.S. Cl.
CPC ...
324244 ; 33356 ; 1286531 ; 32420712 ; 324225 ; 324247 ; 324248 ;
Abstract

An apparatus for measuring a weak magnetic field in a background D.C. magnetic field such as the earth's magnetic field or the like includes a magnetic pickup portion that is supported by a support mechanism which does not impede minute movement in the x- and y-axis direction. A pair of A.C. linear gradient magnetic fields whose directions of gradients are parallel to the x-axis and y-axis, respectively, are used for obtaining reference signals for sensing the position of the pickup portion. The frequencies of the A.C. linear gradient magnetic fields are set to be sufficiently higher than the frequency of the weak magnetic field that is to be measured. The A.C. linear gradient magnetic fields are provided by A.C. current flowing in two pairs of linear conductors which are perpendicular to each other.


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