The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 1997
Filed:
Feb. 24, 1995
Masanobu Miyashita, Tokyo, JP;
Kenji Okajima, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
The images of an object equivalent to those obtained when as object is viewed respectively by the right and left eyes are subdivided into small areas with overlaps allowed therebetween and are Fourier transformed to achieve a local Fourier transform for the images. Phase difference of Fourier transforms is obtained according to the right and left local Fourier transform images of a reference image which is stored beforehand in a storage memory. Alternatively, a Fourier transform power spectrum is obtained. Disparity is represented in terms of a phase difference or in the form of a Fourier transform power spectral pattern. According to either one of the above results, and on the basis of a local Fourier transform of an input image including the reference image, an identical object image is estimated. For the image, a local inverse Fourier transform is effected such that geometric mean values are attained between the right and left images so as to segment an image matching the reference image and, also, with respect to disparity.