The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 1997
Filed:
Dec. 13, 1995
Bok S Byun, Plano, TX (US);
E Stuart Nelan, Dallas, TX (US);
Atlantic Richfield Company, Los Angeles, CA (US);
Abstract
A computer-implemented method and system of correcting seismic survey data for the effects of NMO stretch is disclosed. The method operates upon a CDP gather of seismic survey data after normal move-out correction (NMO) has been applied. A semblance analysis is used to derive a stretch coefficient .kappa. profile over the gather, as a function of time and offset. The values of the stretch coefficient profile .kappa. are used in producing a time-varying filter that is applied, preferably by way of a time-domain multiplication, to incremental windows in time for each trace, with the products added to one another to generate a corrected trace. After all of the traces in the gather are corrected, an event-weighted filter is applied to the traces by way of a correlation operation, to remove high-frequency artifacts in the corrected traces. The corrected and filtered traces are then ready for stacking and conventional processing.