The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 1997
Filed:
Dec. 30, 1994
Applicant:
Inventor:
Tae-Seong Jang, Busan, KR;
Assignee:
Samsung Electronics Co., Ltd., Suwon, KR;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C / ;
U.S. Cl.
CPC ...
365201 ; 371 211 ;
Abstract
A test circuit shortens test time during testing reliability of a chip. The test circuit comprises a bit line level sensing circuit connected to a bit line and transferring data in response to a voltage level of the data when a memory cell data is transferred to the bit line, a bit line level sensing control circuit for controlling a driving operation of the bit line level sensing circuit, and transfer device for transferring the data transferred from the bit line level sensing circuit to an outside of the chip, so that the test circuit tests whether the memory cell is defective or not.