The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 1997
Filed:
Jun. 07, 1995
Phillip V Mitchell, Simi Valley, CA (US);
David M Pepper, Malibu, CA (US);
Thomas R O'Meara, Malibu, CA (US);
Marvin B Klein, Pacific Palisades, CA (US);
Stephen W McCahon, Newbury, CA (US);
Gilmore J Dunning, Newbury Park, CA (US);
Hughes Aircraft Company, Los Angeles, CA (US);
Abstract
An ultrasound detection system that is relatively insensitive to rough workpiece surfaces, suppresses low frequency noise, and provides high sensitivity without the need for active stabilization. An optical probe beam is reflected and phase modulated by a workpiece surface that is being vibrated by ultrasound. A time-delay interferometer optically interferes the phase modulated probe beam with a time-delayed replica of itself. The optical interference generates optical interference fringes that move in accordance with the workpiece surface velocity. The interference fringes are detected by a non-steady-state photo-electromotive-force (NSS-photo-EMF) detector that generates an output signal when the frequency of fringe motion exceeds a predetermined threshold.