The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 1997
Filed:
Jul. 05, 1996
Amir A Naqwi, Shoreview, MN (US);
TSI Incorporated, St. Paul, MN (US);
Abstract
An apparatus for non-contact measurement of particles, fibers and other light scattering elements includes two laser beams that intersect one another to form a measuring region within a composite flow. Particles in the flow scatter the laser energy as they traverse the measuring region. Scattered energy is received by a pair of optical detectors that generate respective electrical signals based on received energy. The detectors have selectively contoured non-rectangular apertures to controllably vary transmittance and as a result generate phase differences according to a corresponding non-linear function that relates the phase differences to particle diameters. One particularly effective aperture shape includes opposite sides contoured according to a lognormal function, to resemble an onion or tear drop. Triangular and trapezoidal apertures also can be used to achieve non-linear functions. In alternative embodiments, rectangular apertures are used in combination with energy attenuation filters with selective gradients in thickness or transmissivity. The result is a selected variance of transmittance in the detector similar to that achieved by controlling the aperture shape.