The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 1997
Filed:
Nov. 16, 1995
Raymond S Markowitz, Elkins Park, PA (US);
Xiaoguang G Sun, King of Prussia, PA (US);
AEL Industries, Inc., Lansdale, PA (US);
Abstract
A status monitoring system for evaluating the condition of an electrode implanted in the body of a mammal. The system comprises a modulator for modulating interrogation signals on an electrode of an implanted device, and a monitor for analyzing modulated interrogation signals being reflected by the electrode. The monitor comprises a transmitter for transmitting interrogation signals, a receiver for receiving and processing the signals reflected by the electrode, and a microprocessor for controlling the transmitter and the receiver. The microprocessor producing electrode condition data from the signals processed by the receiver. The invention further comprises a communication system in communication with the monitoring device for transmitting the electrode condition data to a remote location. The interrogation signals are transmitted by the transmitter onto the electrode. The interrogation signals are modulated on the electrode by combining with a modulation signal generated by the modulator. The modulator is activated by the interrogation signals. The modulated interrogation signals are reflected by the electrode and received by the receiver. The receiver receiving and processing the received signal into a form usable by the microprocessor, the microprocessor producing therefrom the electrode condition data.