The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 1997

Filed:

Sep. 25, 1995
Applicant:
Inventors:

Bernd Spruck, Mogglingen, DE;

Gerhard Herrmann, Aalen, DE;

Assignee:

Carl-Zeiss-Stiftung, Heidenheim, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03B / ; G03B / ;
U.S. Cl.
CPC ...
396432 ; 396268 ; 359368 ; 359381 ;
Abstract

Before the exposure of a film, the brightness of the miscroscope image is determined with a sensor by multiple constant (.tau.) which characterizes the dependence of the microscope image with time is determined. The film is subsequently exposed for a single exposure time (D.sub.c) which takes into account the dependence with time of the microscope image. The process is particularly suitable for microphotography of fluorescence pictures with fluorescence which bleaches out (fading). By the display of both the time constant (.tau.) and also the required exposure time, it can be estimated in advance, before exposure of the film, whether the dependence of the fluorescence on time permits microphotography with a sufficient exposure of the film, in the microscope conditions which have been set. A multiple exposure of the film is not required. A photodiode is provided for exposure measurement, and its photocurrent is integrated over time, the integration time being varied in dependence on the exposure measurement signal.


Find Patent Forward Citations

Loading…