The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 1997
Filed:
Aug. 31, 1995
Tatsuo Igushi, Miyanonigashi-machi, JP;
Horiba, Ltd., Kyoto, JP;
Abstract
A dry particle-size distribution measuring apparatus capable of conducting a measurement using a small quantity of sample. An optical system, a sample detector, a controller, an operating portion, and a sample-supplying portion which intermittently supplies a sample are provided. The optical system has a laser beam source emitting a laser beam, a collecting lens, and a detector which detects scattered or transmitted light. The sample supply-detecting means has a light transmitter and a light receiver provided between the sample-supplying portion and the optical system. The controlling and operating portion has a CPU which receives a detected signal from the detector and measures the particle-size distribution on the basis of the scattered or transmitted light data from the sample.