The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 1997
Filed:
Jul. 22, 1996
Tadashi Kajino, Okazaki, JP;
Nidek Co., Ltd., Gamagori, JP;
Abstract
A lens meter in which a measuring light flux is projected against a lens to be examined and the optical characteristics of the examined lens are measured in reference to the position of an image formed on a light receiving element by the measuring light flux passed through the examined lens, comprises a device changing-over to a mode for measuring an additive diopter of a progressive focus lens, a device for measuring the refractive power of the lens continuously, a device for sensing a reference position having a predetermined optical characteristics of the progressive focus lens, a device for sensing dislocation between each measuring position and the reference position by sensing movement distance of the lens, a device for determining whether the value of the additive diopter obtained on the basis of the measurement by the measuring device is biggest or not, a device for storing the measuring position by the position sensing device when the value of the additive diopter is biggest, and a device for displaying the measuring position when the value of the additive diopter is biggest. In case of that, the lens meter comprises a device for dividing measurement process in the additive diopter measuring mode into plural measurement processes and displaying the respective measurement process, a device for generating a process change signal of respective measurement process divided as above, and a device for indicating the measurement process of the present time among the plural measurement processes.