The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 1997
Filed:
Jun. 01, 1994
Hauke Schmidt, Ulm, DE;
Roland Klinnert, Neu-Ulm, DE;
Rudi Kober, Oberdischingen, DE;
Peter Bock, Washington, DC (US);
Robert Bosch GmbH, Stuttgart, DE;
Abstract
Artificial Intelligence (AI) techniques are used for processing data having multiple possible values, for example, gray-scale values of pixels of an image. This is useful in scanning of digitally-coded image data to detect anomalies, for example defects in some of a series of manufactured products. The preferred processing apparatus has either one processing channel or multiple parallel processing channels. The apparatus samples or scans incoming signals to produce a matrix of scan values, selects subsets of the scan values to define samples, extracts at least one feature, such as mean image brightness (MM), activity (MA), gradient absolute value (MG) and/or gradient direction (MD) from each sample, uses the at least one feature as an address to retrieve, from a table, a corresponding probability-of-occurrence value, derives, from the probability-of-occurrence values of a plurality of the samples, a decision value, and compares the decision value with a predetermined threshold value. The probability-of-occurrence values are stored in the table during a 'learning' procedure.