The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 1997

Filed:

Aug. 11, 1995
Applicant:
Inventors:

S Joe Qin, Austin, TX (US);

Ricardo H Dunia, Austin, TX (US);

Randall L Hayes, Georgetown, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371 48 ; 371 26 ; 36455101 ; 36457102 ;
Abstract

A method and apparatus is provided for detecting a faulty sensor within a process control system having a set of sensors, each of which produces an associated sensor output signal. The method and apparatus produce a set of sensor estimate signals from the sensor output signals using principal component analysis and then determine a validity index for each of the sensors as a ratio of two residuals, wherein each of the residuals represents a different measure of the difference between the sensor output signals and the sensor estimate signals. The determined validity indexes are then used to detect a failure of one of the sensors and/or to identify which one of the sensors has failed.


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