The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 1997
Filed:
May. 31, 1996
Applicant:
Inventor:
Erkki Yli-Vakkuri, Tampere, FI;
Assignee:
Tamglass Engineering OY, Tampere, FI;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356376 ; 356377 ; 364559 ; 364560 ;
Abstract
The invention relates to a method for measuring the degree of bending in a bent glass sheet. The measuring is effected by cameras having a common imaging field within the boundaries of a surface being measured. The cameras are set at an arbitrary but stationary angle relative to each other. The glass surface along a profile to be measured is made visible to the cameras by an illuminating line whose light has a high intensity over the wavelength ranges of 250-330 nm. Hence, an extremely thin film of tin, left on the glass surface in the manufacture thereof, becomes visible.