The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 1997

Filed:

Dec. 27, 1995
Applicant:
Inventor:

Hideki Wakamatsu, Hyogo, JP;

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
324445 ; 324439 ;
Abstract

An electromagnetic induction-type probe, for measuring the electrical properties of a solution, exhibits both a reduced size and a wide band property. The probe includes a primary transformer, composed of a toroidal core with a primary coil winding, a secondary transformer composed of a toroidal core with a secondary, coil winding, an electrostatic shield and coaxial cables which connect the probe and the main frame of a measuring instrument. The structure of the probe is symmetrical in order to eliminate measurement errors due to the asymmetry of the electrical field produced in the solution. The symmetry of the electrical field in the solution is maintained up to the high-frequency region and a wide-band effectiveness is realized by connecting the center tap terminal of a balancer to the outer conductors of the coaxial cables and the other terminals of the balancer to both ends of the gap of the electrostatic shield. Since the balancer can be contained in the handle of the probe, the size of the probe is reduced.


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