The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 1997

Filed:

May. 19, 1995
Applicant:
Inventors:

Mark I Lutwyche, Higashimatsuyama, JP;

Yasuo Wada, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250306 ;
Abstract

A plurality of scanning tunnelling microscopes and operating them at a time, a control circuit, a memory circuit and an arithmetic circuit are integrated on the same chip and movement of a movable electrode is controlled by the arithmetic circuit and control circuit on the basis of information stored in the memory circuit. An actuator utilizing electrostatic force is formed and the scanning tunnelling microscope is operated by the actuator. A plurality of movable electrodes are provided with scanning probes, respectively, and the positions of the plurality of movable electrodes relative to objects are controlled at a time.


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Lutwyche, Mark. (1997). Scanning probe microscope (U.S. Patent No. 5679952). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5679952

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