The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 1997
Filed:
Apr. 12, 1995
Applicant:
Inventor:
Adrianus Josephus Smulders, San Diego, CA (US);
Assignee:
SKF Condition Monitoring, San Diego, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M / ; G01M / ;
U.S. Cl.
CPC ...
73659 ; 73660 ; 73593 ; 162262 ; 364508 ; 36455106 ;
Abstract
A vibration detecting and condition monitoring system for the press section, including felts, rollers and presses, employing a feature extracting circuit having a selectable plurality of Bessel type bandpass filters and an enveloping circuit to square the bandpassed signal output prior to FFT analysis of the signal. The system enables the enhancement and detection of highly impulsive signals in the frequency domain, that are indicative of defects in machinery operation.
Smulders, Adrianus. (1997). Envelope enhancement system for detecting paper machine press section (U.S. Patent No. 5679900). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5679900
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile