The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 1997
Filed:
Mar. 06, 1995
John M Webster, Forest Hills, NY (US);
Jacqueline M Mew, Forest Hills, NY (US);
Holographics Inc., Long Island City, NY (US);
Abstract
A system for non-destructively inspecting or testing for faults or damage in or beneath the surface of structures, such as debonds or delaminations in composite materials, or cracks, broken stringers, delaminations and the like in structures. High energy acoustic impulses are focused onto a sample point or local area for vibrationally exciting the surface of the structure under inspection. A laser Doppler camera system directs a laser beam onto the excited area and derives from reflected light energy information including time domain signals. A Fast Fourier Transform (FFT) is constructed for each sample point and an analysis made to set aside FFTs deviating from a preselected standard which represent damaged or other anomalous areas. The remaining FFTs represent an average or statistical FFT spectrum of the undamaged or fault-free area. The average FFTs and the deviating FFTs are then subtracted to provide a clear and unambiguous signal of the fault and other anomalous areas in the structure under test. This information can then be visually displayed as printouts of a contour map or graph to display faults.