The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 1997

Filed:

Jan. 13, 1995
Applicant:
Inventors:

Takeshi Miyazaki, Ebina, JP;

Kazumi Tanaka, Yokohama, JP;

Masanori Sakuranaga, Atsugi, JP;

Tadashi Okamoto, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
436517 ; 436 64 ; 436 65 ; 436164 ; 436518 ; 436531 ; 436533 ; 436805 ; 436813 ; 436814 ;
Abstract

There are provided a method and an apparatus for measuring an immunologically active material by physically or chemically immobilizing material immunologically active to a material to be measured of a specimen to the dehydrated solid fine particles, providing a desirable dispersion comprising said immunologically active material immobilized to said solid fine particles and said specimen in a liquid medium, reacting them to cause a reaction mixture in an agglutinated state and optically measuring said agglutinated state of the reaction mixture to thereby quantitatively determine the content of said material to be measured with an improved accuracy.


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