The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 1997
Filed:
Jun. 05, 1995
Robert O Brandt, Jr, Wilmington, NC (US);
Elwood E Barnes, Cochranville, PA (US);
Ronald Bernardini, Downingtown, PA (US);
Phillip Rene Reger, Newtown Square, PA (US);
Mars Incorporated, McLean, VA (US);
Abstract
A profile sensor apparatus and method for measuring the contours and/or the thickness of a document or other thin sheet material is disclosed. In one embodiment, a planar beam assembly has a roller wheel attached to a first end and a mounting brace attached to a second end. The planar beam assembly includes at least one strain sensor and a flexible substrate, wherein the substrate may be coated with a visco-elastic polymer layer for damping any resonant vibrations which may occur during operation. A hard reference surface is located opposite the roller wheel. A mechanical preload biases the roller wheel to contact the reference surface with a predetermined amount of force to ensure correct operation. As a document passes between the reference surface and roller wheel, the roller wheel is displaced which in turn causes the planar beam assembly to flex. As the planar beam assembly deforms the strain sensor generates electrical signals which are proportional to the profile and/or the thickness of the document.