The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 1997
Filed:
Jul. 14, 1995
Atsushi Maki, Hachioji, JP;
Adi Bonen, Willowdale, CA;
Yoshitoshi Ito, Ome, JP;
Yuichi Yamashita, Hachioji, JP;
Yukiko Hirabayashi, Kokubunji, JP;
Hideaki Koizumi, Tokyo, JP;
Fumio Kawaguchi, Hinode-Machi, JP;
Hideji Fujii, Hinode-Machi, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
An imaging method for spatial distributions of concentrations of absorbers distributed in an object including a radiation step of applying pulsating or continuous light radiated from predetermined incident positions with predetermined wavelengths to the object in the form of a scattering medium containing the absorbers, and a detection step of detecting intensities of light passing through the object at predetermined detection positions. The imaging method also includes a step of finding a plurality photon paths for a plurality of pairs of the incident and detected positions of a model with similar dimensions to the object but without absorbers starting at the incident positions and ending at the detected positions, a step of finding averaged photon-path lengths of the photon paths starting at the incident positions and ending at the detection positions in the model by simulation, a step of finding spatial distributions of absorber concentrations from the averaged photon-path lengths, radiated intensities of the radiated light applied to the object, detected intensities of light detected at the detection positions and optical constants of the absorbers for the radiated light applied to the object, and a step of displaying the spatial distributions of the absorber concentrations.