The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 1997

Filed:

Jun. 22, 1995
Applicant:
Inventor:

Hidehiro Ogawa, Funabashi, JP;

Assignee:

Niko Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03B / ; G03B / ;
U.S. Cl.
CPC ...
396234 ; 396290 ;
Abstract

A photometer for a camera that performs multi-area photometry and displays the exposure deviation to the photographer. The photometer includes a light measuring device with a plurality of photometric elements that perform photometry at a plurality of areas within the photographic field. A photometric value determining section calculates an effective photometric value using a weighted addition of each photometric value according to the given photometric mode. A standard value determining section calculates a reference photometric value using a predetermined, specified weighted addition of each photometric value. A deviation determining section calculates the deviation in the logarithmic values of the effective photometric value and the reference photometric value. A display device displays the deviation calculated by the deviation determining section.


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