The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 1997

Filed:

Jun. 06, 1995
Applicant:
Inventors:

Riaz A Moledina, Woodside, CA (US);

Kok S Chen, Sunnyvale, CA (US);

Iue-Na Swen, Cupertino, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
395502 ; 358525 ;
Abstract

Disclosed is a technique for N-dimensional image data interpolation processing utilizing a multi-stage technique. Each stage processes one of the N-dimensions to constrain output data in that dimension. Subsequent processing in successive stages only occurs within the confines of the constrained output of the previous stage. Multiple data values can be simultaneously processed in the different stages, to pipeline the interpolation process.


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