The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 1997

Filed:

Jul. 07, 1995
Applicant:
Inventors:

Maarten de Hoop, Golden, CO (US);

Robert Burridge, Ridgefield, CT (US);

Carl Peter Spencer, Great Abington, GB;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01V / ;
U.S. Cl.
CPC ...
367 50 ; 367 38 ; 364421 ;
Abstract

A method is provided for processing seismic data samples obtained from seismic signals propagating in an anisotropic medium. The data samples are associated with scattering angles and azimuth at each migration dip at each image point of the medium. An inverse operator is then applied to the samples so as to provide intermediate anisotropic elastic parameter combinations for each migration dip at each point of the medium. The inverse operator comprises an inverse of a scattering function for variations in elastic parameters from a reference medium against scattering angle and migration dip. The intermediate anisotropic elastic parameter combinations are then migrated to their proper locations.


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